| Title | Bi2Sr2CuO6+δ/ACuO2 (A = Ca,Sr) superconducting multilayers obtained by molecular beam epitaxy |
|---|---|
| Publication Type | Articolo su Rivista peer-reviewed |
| Year of Publication | 1999 |
| Authors | Salvato, M., Attanasio C., Carbone G., Di Luccio Tiziana, Prischepa S.L., Russo R., and Maritato L. |
| Journal | Physica C: Superconductivity and its Applications |
| Volume | 316 |
| Pagination | 215-223 |
| ISSN | 09214534 |
| Keywords | Bismuth compounds, Copper oxides, Electric resistance, Electron diffraction, High temperature superconductors, Molecular beam epitaxy, Multilayers, Reflection high energy electron diffraction, Superconducting multilayers, Temperature, X ray diffraction |
| Abstract | Bi-based superconducting multilayers, consisting of Bi2Sr2CuO6+δ (2201) layers alternately stacked with CaCuO2 or SrCuO2 layers, have been deposited by Molecular Beam Epitaxy (MBE) using co-deposition and growth interruption techniques. In situ Reflection High Energy Electron Diffraction (RHEED) has been used to monitor the surface of the different layers giving evidence of a two-dimensional growth mode. The layered structure of the samples has been confirmed by X-ray diffraction analyses. Resistive measurements have shown superconducting 2201/CaCuO2 samples with critical temperatures strongly depending on the thickness of the CaCuO2. The 2201/SrCuO2 multilayers do not show a zero electrical resistance above 4.2 K, but the resistance vs. temperature curves present a sharp decrease around 60 K indicative of a superconducting onset. |
| Notes | cited By 6 |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032641471&doi=10.1016%2fS0921-4534%2899%2900258-0&partnerID=40&md5=df868a3614c7c569facbe71725f9504e |
| DOI | 10.1016/S0921-4534(99)00258-0 |
| Citation Key | Salvato1999215 |
