Produzione Scientifica
Found 5 results
Filters: Keyword is X ray diffraction analysis and Author is Rizzo, A. [Clear All Filters]
Effect of the substrate temperature on zirconium oxynitride thin films deposited by water vapour-nitrogen radiofrequency magnetron sputtering,
, Thin Solid Films, Volume 518, Number 8, p.1943-1946, (2010)
Synthesis and characterization of titanium and zirconium oxynitride coatings,
, Thin Solid Films, Volume 517, Number 21, p.5956-5964, (2009)
Influence of growth rate on the structural and morphological properties of TiN, ZrN and TiN/ZrN multilayers,
, Thin Solid Films, Volume 515, Number 17, p.6665-6671, (2007)
Structural and optical properties of silver thin films deposited by RF magnetron sputtering,
, Thin Solid Films, Volume 396, Number 1-2, p.29-35, (2001)
Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance,
, Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)