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Produzione Scientifica

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Filters: Keyword is Bragg-Brentano X ray diffraction patterns  [Clear All Filters]
1999
Characterisation of ZnS:Mn thin films by Rietveld refinement of Bragg-Brentano X-ray diffraction patterns, Tagliente, M.A., Penza Michele, Gusso M., and Quirini A. , Thin Solid Films, Volume 353, Number 1, p.129-136, (1999)