Phase-unifying mirrors for high-power XeF excimer lasers, de Tomasi, F., Aghamkar P., Perrone M.R., Protopapa Maria Lucia, Piegari A., Andre' B., and Ravel G. , Applied Physics Letters, Volume 82, Number 12, p.1809-1811, (2003)

Influence of standing-wave electric field pattern on the laser damage resistance of HfO2 thin films, Protopapa, Maria Lucia, Alvisi Marco, de Tomasi F., Di Giulio M., Perrone M.R., and Scaglione S. , Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films, Volume 20, Number 3, p.643-650, (2002)

Influence of the standing wave electric field pattern on the laser damage resistance of HfO2 thin films, Alvisi, Marco, Di Giulio M., Perrone M.R., Protopapa Maria Lucia, and Scaglione S. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 4347, Boulder, CO, p.102-107, (2001)

Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films, Alvisi, Marco, de Tomasi F., Perrone M.R., Protopapa Maria Lucia, Rizzo A., Sarto F., and Scaglione S. , Thin Solid Films, Volume 396, Number 1-2, p.44-52, (2001)

Comparison of the optical properties and UV radiation resistance of HfO2 single layers deposited by reactive evaporation, IAD, and PIAD, Thielsch, Roland, Feigl Torsten, Kaiser Norbert, Martin Sven, Scaglione Salvatore, Sarto Francesca, Alvisi Marco, and Rizzo Antonella , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3902, Boulder, CO, USA, p.182-193, (2000)

Correlation between the structural and optical properties of ion assisted afnia thin films, Scaglione, Salvatore, Sarto Francesca, Alvisi Marco, Rizzo Antonella, Perrone M.R., and Protopapa Maria Lucia , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3902, Boulder, CO, USA, p.194-203, (2000)

Effects of structural properties and electric field distribution on the laser-damage threshold of HfO2 thin films, Protopapa, Maria Lucia, Alvisi Marco, Di Giulio M., de Tomasi F., Perrone M.R., Torsello G., and Valentini A. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 4070, Potenza-Lecce, Italy, p.380-386, (2000)

HfO2 films with high laser damage threshold, Alvisi, Marco, Di Giulio M., Marrone S.G., Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Thin Solid Films, Volume 358, Number 1, p.250-258, (2000)

Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)

Dual ion beam sputtering coating of plastic substrates: Improvement of film/substrate adhesion by minimizing the total stress at the interface, Sarto, F., Alvisi Marco, Caneve L., AbuHassan L.H., and Scaglione S. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.66-75, (1999)

Laser damage testing of SiO2 and HfO2 thin films, Di Giulio, M., Alvisi Marco, Perrone M.R., Protopapa Maria Lucia, Valentini A., and Vasanelli L. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.337-346, (1999)

Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance, Alvisi, Marco, Scaglione S., Martelli S., Rizzo A., and Vasanelli L. , Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)

The influence of ion mass and energy on the composition of IBAD oxide films, Rizzo, A., Alvisi Marco, Sarto F., Scaglione S., and Vasanelli L. , Surface and Coatings Technology, Volume 108-109, p.297-302, (1998)

Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)