Investigation of the physical properties of ion assisted ZrN thin films deposited by RF magnetron sputtering, Signore, M.A., Valerini D., Rizzo A., Tapfer Leander, Capodieci Laura, and Cappello A. , Journal of Physics D: Applied Physics, Volume 43, Number 22, (2010)

Characterization of zirconium oxynitride films obtained by radio frequency magnetron reactive sputtering, Signore, M.A., Rizzo A., Mirenghi L., Tagliente M.A., and Cappello A. , Thin Solid Films, Volume 515, Number 17, p.6798-6804, (2007)

Effect of growth catalysts on gas sensitivity in carbon nanotube film based chemiresistive sensors, Penza, Michele, Cassano Gennaro, Rossi R., Rizzo A., Signore M.A., Alvisi Marco, Lisi N., Serra Emanuele, and Giorgi R. , Applied Physics Letters, Volume 90, Number 10, (2007)

Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films, Alvisi, Marco, de Tomasi F., Perrone M.R., Protopapa Maria Lucia, Rizzo A., Sarto F., and Scaglione S. , Thin Solid Films, Volume 396, Number 1-2, p.44-52, (2001)

Momentum transfer parameter in argon-assisted carbon coatings, Rizzo, A., Alvisi Marco, Sarto F., and Scaglione S. , Thin Solid Films, Volume 384, Number 2, p.215-222, (2001)

Structural and optical properties of silver thin films deposited by RF magnetron sputtering, Rizzo, A., Tagliente M.A., Alvisi Marco, and Scaglione S. , Thin Solid Films, Volume 396, Number 1-2, p.29-35, (2001)

Influence of the momentum transfer on the structural and optical properties of ZnSe thin films prepared by r.f. magnetron sputtering, Rizzo, A., Tagliente M.A., Caneve L., and Scaglione S. , Thin Solid Films, Volume 368, Number 1, p.8-14, (2000)

Dependence of the HfO2 thin film structure on the momentum transfer in ion beam assisted deposition, Scaglione, S., Sarto F., Rizzo A., and Alvisi Marco , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3578, Boulder, CO, USA, p.154-161, (1999)

Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Thin Solid Films, Volume 338, Number 1-2, p.269-275, (1999)

Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance, Alvisi, Marco, Scaglione S., Martelli S., Rizzo A., and Vasanelli L. , Thin Solid Films, Volume 354, Number 1, p.19-23, (1999)

Structural and optical properties of zinc selenide thin films deposited by RF magnetron sputtering, Rizzo, A., Caneve L., Scaglione S., and Tagliente M.A. , Proceedings of SPIE - The International Society for Optical Engineering, Volume 3738, Berlin, Ger, p.40-47, (1999)

Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique, Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo A., Scaglione S., and Vasanelli L. , Conference on Lasers and Electro-Optics Europe - Technical Digest, Glasgow, Scotland, p.311, (1998)

Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)