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Produzione scientifica

Found 2 results
Filtri: Autore is Vasanelli, L. and Parola Chiave is Atomic force microscopy  [Clear All Filters]
2000
Structural and chemical investigation of surface and interface of multilayer optical coatings deposited by DIBS, Alvisi, Marco, Mirenghi L., Tapfer Leander, Rizzo A., Ferrara Maria Cristina, Scaglione S., and Vasanelli L. , Applied Surface Science, Volume 157, Number 1, p.52-60, (2000)
1998
Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo A., Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)