Titolo | Experimental results on silicon annealing by a long-pulse, high-power XeCl laser system |
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Tipo di pubblicazione | Presentazione a Congresso |
Anno di Pubblicazione | 2000 |
Autori | Murra, D., Bollanti S., Bonfigli F., Della Sala Dario, Di Lazzaro P., and Letardi T. |
Conference Name | Proceedings of SPIE - The International Society for Optical Engineering |
Editore | Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States |
Conference Location | Potenza-Lecce, Italy |
Parole chiave | Amorphous silicon, Annealing, Beam homogenizer, Density (optical), Excimer lasers, glass, Grain size and shape, High power lasers, Laser beams, Pulsed laser applications, Semiconducting silicon, Silicon annealing, Substrates |
Abstract | The XeCl laser facility Hercules, delivering a maximum energy of 8 J in 160 ns FWHM, has been used to irradiate amorphous silicon (a-Si) films on glass substrate. We designed an optical homogeneizer to reshape the large cross-section of the laser beam (10×5) cm2, in order to reach a fluence up to 0.5 J/cm2 over a (13×1) cm2 area. The beam resulted spatially homogenous within 10% (referred to peak-to-peak fluctuations). We obtained poly-silicon films with grain size ranging from 0.1 to 2 μm, depending on the laser energy density. These preliminary results show that the grain size is critically fluence-dependent when the so-called super-lateral-growth regime is approached (approximately at 0.42 J/cm2 for a 50 nm-thick a-Si film), with a maximum slope of the grain size vs. energy density greater than 0.5 μm/(mJ/cm2). |
URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0033905445&partnerID=40&md5=6a7825c79fad77436ba63d01dddb2a43 |
Citation Key | Murra2000345 |