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Bi-based superconducting multilayers obtained by molecular beam epitaxy

TitoloBi-based superconducting multilayers obtained by molecular beam epitaxy
Tipo di pubblicazioneArticolo su Rivista peer-reviewed
Anno di Pubblicazione1999
AutoriSalvato, M., Attanasio C., Carbone G., Di Luccio Tiziana, Prischepa S.L., Russo R., and Maritato L.
RivistaInternational Journal of Modern Physics B
Volume13
Paginazione991-996
ISSN02179792
Abstract

High temperature superconducting multilayers have been obtained depositing Bi2Sr2CuO6+δ (2201) and ACuO2 layers, where A is C a or Sr, by Molecular Beam Epitaxy (MBE) on M gO and SrTiO3 substrates. The samples, formed by a sequence of 2201/ACuO2 bilayers, have different thickness of ACuO2 layers while the thickness of the 2201 layers is kept constant. The surface structure of each layer has been monitored by in situ Reflection High Energy Electron Diffraction (RHEED) analysis which has confirmed a 2D nucleation growth. X-ray diffraction (XRD) analysis has been used to confirm that the layered structure has been obtained. Moreover, a one-dimensional X-ray kinematic diffraction model has been developed to interpret the experimental data and to estimate the period of the multilayers. Resistive measurements have shown that the electrical properties of the samples strongly depend on the thickness of the ACuO2 layers. © World Scientific Publishing Company.

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-27844603396&partnerID=40&md5=ef85d31ca1a752af9fd3b3d218dd3493
Citation KeySalvato1999991